From time to time I have shared here on “Watt’s Up?” a number of different ways the system DC power supply in your test set up impacts your test time, and recommendations on how to make significant improvements in the test throughput. Many of these previous posts are based on the first five of ten hints I’ve put together in a compendium entitled “10 Hints on Improving Throughput with your Power Supply” (click here for hints 1-5).
Oscilloscopes, data acquisition, and a variety of other test equipment are often used to capture and digitize waveforms and store large arrays of data during test, the data is then downloaded to a PC. These data arrays can be quite large, from thousands to millions of measurements. For long-term data logging the data files can be many gigabytes in size. These data files can take considerable time to transfer over an instrument bus, greatly impacting your test time.
Advanced system power supplies incorporating digitizing measurement systems to capture waveform measurements like inrush current are no different. This includes a number of system DC and AC power products we provide. Even though you usually have the choice of transferring data in ASCII format, one thing we recommend is instead transfer data in binary format. Binary data transmission requires fewer bytes reducing transfer time by a factor of two or more.
Further details about using binary mode data transfers can be found in hint 7 of another, earlier compendium we did, entitled “10 hints for using your power supply to decrease test time” (click here to access). Between these two compendiums of hints for improving your test throughput I expect you should be able find a few different ideas that will benefit your particular test situation!