I have provided here on “Watt’s up?” a number of ideas on how you can improve your test throughput from time to time, as it relates on how to make better use of you system power supplies to accomplish this. I have categorized these ideas on how to improve throughput as either fundamental or advanced.
In “How fundamental features of power supplies impact your test throughput” (click here to review) I shared in a two-part posting definitions of key fundamental power supply features that impact test throughput and ways to make improvements to literally shave seconds off of your test time.
One example (of several) of an advanced idea on improving throughput I previously shared here is “Using the power supply status system to improve test throughput” (click here to review). Here I explain how, by monitoring the status system, you can improve throughput by not relying on using excessively long fixed wait statements in your programming.
I hope you have found these ideas helpful. If you would like to learn more about using your system power supply to improve your test throughput I will be presenting a live web-based seminar this week, in just a couple of days, April 30th, at 1:00 PM EST on this very topic!
In this seminar I will go through a number of things I’ve shared here on “Watt’s up?” in the past, but in greater detail. In addition, I have also prepared several new ideas as well in this seminar that you might find of help for your particular test situation. You can register online at the following (click here to access seminar description and registration). In case you miss the live event I expect you will be able to register and listen to seminar afterward as well, as it will be recorded.
So if improving your test throughput is important to you I hope you are able to attend the seminar!