In part 1 of” How fundamental features of DC power supplies impact your test throughput” (click here to access) I shared definitions of some of the fundamental power supply features that impact test throughput, including:
- Command processing time
- Up-programming response time
- Down-programming response time
Another fundamental DC power supply feature impacting test throughput is its measurement time. There are actually two aspects to a DC power supply’s measurement time as depicted in Figure 1:
- Measurement settling time
- Measurement integration time
Figure 1: DC power supply measurement time
A good indicator of a DC power supply having a high performance measurement system is having programmable measurement integration time, or aperture time, often programmed in power line cycles (PLCs). One reason for having a programmable integration time is for minimizing any 50 or 60 Hz AC line ripple getting into the DC measurement, by setting the time one or more multiples of a PLC. Setting the time to 1 PLC provides good ripple rejection with relatively good throughput. When AC line ripple is not an issue the integration time can be set even smaller than 1 PLC, further reducing measurement time. When the DC power supply has a programmable measurement integration time it will no doubt also have a fast-responding measurement system as well, typically just milliseconds, to complement the higher achievable throughput with programmable measurement integration time.
In comparison basic DC power supplies commonly use a 100 millisecond fixed integration time to support AC ripple rejection for both 50 and 60 Hz line frequencies. They also have low bandwidth, slow-responding measurement systems, which can long time to settle after any step change in loading, before a valid measurement can be taken.
We have just introduced our Advanced Power System (APS) DC power supplies. This is a family of high-performance, high power (1 and 2 kW) DC power supplies designed to address the most demanding test challenges. These fundamental throughput-related features for APS are typically more than two orders of magnitude faster compared to more basic-performance DC power supplies, providing much better throughput in manufacturing test. A colleague of mine recently posted details of their introduction on his “General Purpose Electronic Test Equipment (GEPETE)” blog (click here to access) which I believe you will find of interest. Included in this introduction is a link on throughput that takes you to a series of application briefs I have written that go into more detail on improving test throughput with the DC power supply, which you may find very useful.
So how much test throughput improvement might you expect to see by switching from a basic-performance DC source to a high-performance DC source? Well, it really depends on how much the testing makes use of the DC power supply. If it only uses the power supply to provide a fixed DC bias to the device under test (DUT) that never changes for the duration of the test then it will not make a significant difference. More often than not however, a DUT is tested at several bias voltages with several current drain measurements taken for the various bias voltage settings and DUT operating modes. This can add up to a considerable amount of test time. In this case a high-performance DC power supply can more than pay for itself many times over due to improved test throughput. To get an idea of the kind of difference a high-performance DC power supply can make I set up a representative benchmark test It compares the throughput performance one of our new APS DC power supplies to that of a more basic-performance power supply. If you are interested in finding out how much difference it made, I made a video of this benchmark testing, entitled “Increasing Test Throughput with Advanced Power System” (click here to access). All I am going to say here is it is an impressive difference but you will need to watch the video to see how much difference!